TY  - JOUR
A1  - Taudt, Christopher
A1  - Leyens, Christoph
A1  - Hartmann, Peter
A1  - Molotnikov, Andrey
A2  - Helvajian, Henry
A2  - Gu, Bo
A2  - Chen, Hongqiang
T1  - Darkfield-scattering surface analysis in powder-based AM-processes: analysis of a multiwavelength approach
T2  - Laser 3D Manufacturing XII
T3  - Proceedings of SPIE - 13354 
Y1  - 2025
UR  - https://libdoc.fh-zwickau.de/opus4/frontdoor/index/index/docId/18317
N1  - Referenz (Hochschulbibliographie), kein Volltext
PB  - SPIE
CY  - Bellingham, WA
ER  -