MetadatenAuthor: | Karsten Schmiedel, Alexander Kabardiadi-Virkovski, Tobias Baselt, Peter Hartmann |
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DOI: | https://doi.org/10.1117/12.2673847 |
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ISBN: | 9781510664456 Available in library? |
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Parent Title (English): | Optical Measurement Systems for Industrial Inspection XIII : 26-29 June 2023, Munich, Germany |
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Series (Serial Number): | Proceedings of SPIE (12618) |
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Publisher: | SPIE |
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Editor: | Peter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves |
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Document Type: | Part of a Book |
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Language: | English |
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Year of first Publication: | 2023 |
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Article Number: | 126182O |
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Note: | Referenz (Hochschulbibliographie), kein Volltext |
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Faculty: | Westsächsische Hochschule Zwickau / Physikalische Technik, Informatik |
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Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 621 Angewandte Physik |
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Release Date: | 2024/08/01 |
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